TY - GEN
T1 - ZBL EWS Manuale Utente
AU - Zappa, Diego
AU - Zicchinella, Davide
AU - Faedo, Paolo
PY - 2011
Y1 - 2011
N2 - This document explains how to use the "ZBL" tool which is useful for estimating the maximum threshold of failures during testing of chips on wafers.
It consists of an Excel spreadsheet used to load data for elaboration and contains several sheets with calculations and graphs for evaluation of uploaded datasets and estimated SBL.
Via a macro, all processes required for data processing have been automated: data loading, sorting and filtering, the choice of bin lists of which estimate the SBL and elaboration with generation of an output in Excel format.
AB - This document explains how to use the "ZBL" tool which is useful for estimating the maximum threshold of failures during testing of chips on wafers.
It consists of an Excel spreadsheet used to load data for elaboration and contains several sheets with calculations and graphs for evaluation of uploaded datasets and estimated SBL.
Via a macro, all processes required for data processing have been automated: data loading, sorting and filtering, the choice of bin lists of which estimate the SBL and elaboration with generation of an output in Excel format.
KW - Semiconductor process control
KW - Statistical Bin limit
KW - Semiconductor process control
KW - Statistical Bin limit
UR - http://hdl.handle.net/10807/12176
M3 - Other contribution
ER -