Since their invention scanning tunneling microscopy and atomic force microscopy have emerged as powerful and versatile techniques for atomic and nanometer-scale imaging. In this review we will focus on AFM, whose methods have found applications for imaging, metrology and manipulation at the nanometer level of a wide variety of surfaces, including biological ones. Today AFM is regarded as an essential tool for nanotechnology and a basic tool for material science in general. This motivated the introduction of the wavelet transform in thermally excited dynamic spectroscopy, a new approach to spectroscopy measurements that is the topic of this review. Wavelet transforms allow to reduce the acquisition time to values compatible with practical dynamic force spectroscopy imaging and to apply the analysis simultaneously to all the cantilever modes, either ﬂexural and torsional, within the cut-off frequency of the acquisition system.
|Titolo della pubblicazione ospite||Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale|
|Numero di pagine||28|
|Stato di pubblicazione||Pubblicato - 2012|
- Atomic force microscopy
- dynamic AFM
- force spectroscopy
- wavelet transforms