Wavelet Transforms in Dynamic Atomic Force Spectroscopy

Gabriele Ferrini, Giovanna Malegori

Risultato della ricerca: Contributo in libroChapter

Abstract

Since their invention scanning tunneling microscopy and atomic force microscopy have emerged as powerful and versatile techniques for atomic and nanometer-scale imaging. In this review we will focus on AFM, whose methods have found applications for imaging, metrology and manipulation at the nanometer level of a wide variety of surfaces, including biological ones. Today AFM is regarded as an essential tool for nanotechnology and a basic tool for material science in general. This motivated the introduction of the wavelet transform in thermally excited dynamic spectroscopy, a new approach to spectroscopy measurements that is the topic of this review. Wavelet transforms allow to reduce the acquisition time to values compatible with practical dynamic force spectroscopy imaging and to apply the analysis simultaneously to all the cantilever modes, either flexural and torsional, within the cut-off frequency of the acquisition system.
Lingua originaleEnglish
Titolo della pubblicazione ospiteAtomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
EditorBellitto Victor
Pagine71-98
Numero di pagine28
DOI
Stato di pubblicazionePubblicato - 2012

Keywords

  • Atomic force microscopy
  • dynamic AFM
  • force spectroscopy
  • wavelet transforms

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