Abstract
The surface electronic structure of the clean Si(100)-(2x1) surface at\r\n room temperature is studied by high-resolution electron-energy-loss\r\n spectroscopy. Main absorption edge is detected at similar to 0.4 eV,\r\n which corresponds to the energy gap of the system, further structures\r\n are singled out at 0.8 and 1.25 eV and ascribed to interband electronic\r\n transitions between dimer-related levels. The paramount importance of\r\n cleanness is addressed showing and quantifying the effect of the\r\n residual gas atmosphere (that can be present in ultrahigh vacuum) on the\r\n electronic structure.
| Lingua originale | Inglese |
|---|---|
| pagine (da-a) | 541-545 |
| Numero di pagine | 5 |
| Rivista | Journal of Electron Spectroscopy and Related Phenomena |
| Volume | 76 |
| Numero di pubblicazione | N/A |
| DOI | |
| Stato di pubblicazione | Pubblicato - 1995 |
All Science Journal Classification (ASJC) codes
- Materiali Elettronici, Ottici e Magnetici
- Radiazione
- Fisica Atomica e Molecolare, Ottica
- Fisica della Materia Condensata
- Spettroscopia
- Chimica Fisica e Teorica
Keywords
- ANGLE-RESOLVED-PHOTOEMISSION
- ANTIMONY
- DIMERS
- LOW-TEMPERATURE
- RECONSTRUCTED SURFACES
- SCANNING TUNNELING MICROSCOPY
- SI(001)
- SI(100)2X1 SURFACE
- STATES
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