Abstract
Time- and angle-resolved photoemission spectroscopy (TR-ARPES) provides access to the ultrafast evolution of electrons and many-body interactions in solid-state systems. However, the momentum- and energy-resolved transient photoemission intensity may not be unambiguously described by the intrinsic relaxation dynamics of photoexcited electrons alone. The interpretation of the time-dependent photoemission signal can be affected by the transient evolution of the electronic distribution, and both the one-electron removal spectral function as well as the photoemission matrix elements. Here we investigate the topological insulator Bi1.1Sb0.9Te2S to demonstrate, by means of a detailed probe-polarization dependent study, the transient contribution of matrix elements to TR-ARPES.
Lingua originale | English |
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pagine (da-a) | N/A-N/A |
Numero di pagine | 8 |
Rivista | New Journal of Physics |
Volume | 22 |
DOI | |
Stato di pubblicazione | Pubblicato - 2020 |
Keywords
- matrix-elements
- time- and angle-resolved photoemission spectroscopy (TR-ARPES)
- topological insulators
- ultrafast electron dynamics