Deep neural network for x-ray photoelectron spectroscopy data analysis

Giovanni Drera*, C. M. Kropf, Luigi Ermenegildo Sangaletti

*Autore corrispondente per questo lavoro

Risultato della ricerca: Contributo in rivistaArticolo in rivistapeer review


In this work, we characterize the performance of a deep convolutional neural network designed to detect and quantify chemical elements in experimental x-ray photoelectron spectroscopy data. Given the lack of a reliable database in literature, in order to train the neural network we computed a large (<100 k) dataset of synthetic spectra, based on randomly generated materials covered with a layer of adventitious carbon. The trained net performs as well as standard methods on a test set of ≈500 well characterized experimental x-ray photoelectron spectra. Fine details about the net layout, the choice of the loss function and the quality assessment strategies are presented and discussed. Given the synthetic nature of the training set, this approach could be applied to the automatization of any photoelectron spectroscopy system, without the need of experimental reference spectra and with a low computational effort.
Lingua originaleEnglish
pagine (da-a)015008-N/A
Numero di pagine10
RivistaMachine Learning: Science and Technology
Stato di pubblicazionePubblicato - 2020


  • Neural Networks
  • X-ray photoelectron spectroscopy


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