Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient

Francesco De Nicola; Chiara Pintossi; Francesca Nanni; Ilaria Cacciotti; Manuela Scarselli; Giovanni Drera; Stefania Pagliara; Luigi Ermenegildo Sangaletti; Maurizio De Crescenzi; Paola Castrucci

doi:10.1016/j.carbon.2015.07.096

Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient

Francesco De Nicola, Chiara Pintossi, Francesca Nanni, Ilaria Cacciotti, Manuela Scarselli, Giovanni Drera, Stefania Pagliara, Luigi Ermenegildo Sangaletti, Maurizio De Crescenzi, Paola Castrucci

Risultato della ricerca: Contributo in rivista › Articolo in rivista › peer review

17 Citazioni (Scopus)

Abstract

Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert-Beer law, by measuring film optical spectra. Moreover, the knowledge of the absorption coefficient provides an easier, reliable, and faster method of investigation for generic CNT film thickness. In addition, the absorption coefficient leads to the information of the absorption length for SWCNT and MWCNT films, which is a physical quantity of fundamental interest for optoelectronic applications, such as light emitting diodes, photovoltaics, and in general light absorbers.

Lingua originale	English
pagine (da-a)	28-33
Numero di pagine	6
Rivista	Carbon
Volume	95
DOI	https://doi.org/10.1016/j.carbon.2015.07.096
Stato di pubblicazione	Pubblicato - 2015

Keywords

CNT, photovoltaics

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10.1016/j.carbon.2015.07.096

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title = "Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient",

abstract = "Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert-Beer law, by measuring film optical spectra. Moreover, the knowledge of the absorption coefficient provides an easier, reliable, and faster method of investigation for generic CNT film thickness. In addition, the absorption coefficient leads to the information of the absorption length for SWCNT and MWCNT films, which is a physical quantity of fundamental interest for optoelectronic applications, such as light emitting diodes, photovoltaics, and in general light absorbers.",

keywords = "CNT, photovoltaics, CNT, photovoltaics",

author = "{De Nicola}, Francesco and Chiara Pintossi and Francesca Nanni and Ilaria Cacciotti and Manuela Scarselli and Giovanni Drera and Stefania Pagliara and Sangaletti, {Luigi Ermenegildo} and {De Crescenzi}, Maurizio and Paola Castrucci",

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TY - JOUR

T1 - Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient

AU - De Nicola, Francesco

AU - Pintossi, Chiara

AU - Nanni, Francesca

AU - Cacciotti, Ilaria

AU - Scarselli, Manuela

AU - Drera, Giovanni

AU - Pagliara, Stefania

AU - Sangaletti, Luigi Ermenegildo

AU - De Crescenzi, Maurizio

AU - Castrucci, Paola

PY - 2015

Y1 - 2015

N2 - Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert-Beer law, by measuring film optical spectra. Moreover, the knowledge of the absorption coefficient provides an easier, reliable, and faster method of investigation for generic CNT film thickness. In addition, the absorption coefficient leads to the information of the absorption length for SWCNT and MWCNT films, which is a physical quantity of fundamental interest for optoelectronic applications, such as light emitting diodes, photovoltaics, and in general light absorbers.

AB - Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert-Beer law, by measuring film optical spectra. Moreover, the knowledge of the absorption coefficient provides an easier, reliable, and faster method of investigation for generic CNT film thickness. In addition, the absorption coefficient leads to the information of the absorption length for SWCNT and MWCNT films, which is a physical quantity of fundamental interest for optoelectronic applications, such as light emitting diodes, photovoltaics, and in general light absorbers.

KW - CNT, photovoltaics

UR - http://hdl.handle.net/10807/98147

UR - http://www.journals.elsevier.com/carbon/

U2 - 10.1016/j.carbon.2015.07.096

DO - 10.1016/j.carbon.2015.07.096

M3 - Article

SN - 0008-6223

VL - 95

SP - 28

EP - 33

JO - Carbon

JF - Carbon

ER -

Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient

Abstract

Keywords

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