Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient

Stefania Pagliara, Luigi Ermenegildo Sangaletti, Chiara Pintossi, Giovanni Drera, Paola Castrucci, Francesco De Nicola, Francesca Nanni, Ilaria Cacciotti, Manuela Scarselli, Maurizio De Crescenzi

Risultato della ricerca: Contributo in rivistaArticolo in rivistapeer review

16 Citazioni (Scopus)

Abstract

Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert-Beer law, by measuring film optical spectra. Moreover, the knowledge of the absorption coefficient provides an easier, reliable, and faster method of investigation for generic CNT film thickness. In addition, the absorption coefficient leads to the information of the absorption length for SWCNT and MWCNT films, which is a physical quantity of fundamental interest for optoelectronic applications, such as light emitting diodes, photovoltaics, and in general light absorbers.
Lingua originaleEnglish
pagine (da-a)28-33
Numero di pagine6
RivistaCarbon
Volume95
DOI
Stato di pubblicazionePubblicato - 2015

Keywords

  • CNT, photovoltaics

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