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BISMUTH ON GASB(110): ELECTRONIC AND DIELECTRIC PROPERTIES

  • Luca Gavioli*
  • , Maria Grazia Betti
  • , P Casarini
  • , Carlo Mariani
  • *Autore corrispondente per questo lavoro
  • University of Modena and Reggio Emilia

Risultato della ricerca: Contributo in rivistaArticolopeer review

Abstract

We present a high-resolution electron-energy-loss-spectroscopy study of\r\n the electronic and dielectric properties of the (1 X 1) and (1 X 2)\r\n Bi/GaSb(110) interfaces, in the energy region of the semiconductor bulk\r\n gap. Among the semimetal/III-V(110) interfaces, we found this as the\r\n unique ordered-system showing a semimetallic character when one\r\n monolayer of semimetal is deposited on the (110) surface, at room\r\n temperature. Electronic loss structures induced by transitions among\r\n localized states have been identified for the (1 X 1) interface, the\r\n most prominent lying at about I eV. The (1 X 2) superstructure, produced\r\n through an appropriate thermal treatment, is still semimetallic, while\r\n the electronic loss structures shift to lower energies and present a\r\n clear dependence on the symmetry direction of the surface Brillouin\r\n zone.
Lingua originaleInglese
pagine (da-a)2911-2914
Numero di pagine4
RivistaPhysical Review B-Condensed Matter
Volume49
Numero di pubblicazione4
DOI
Stato di pubblicazionePubblicato - 1994

All Science Journal Classification (ASJC) codes

  • Fisica della Materia Condensata

Keywords

  • HREELS
  • bismuth
  • dielectric properties
  • photoemission
  • semiconductor surfaces

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