Abstract
We present a high-resolution electron-energy-loss-spectroscopy study of
the electronic and dielectric properties of the (1 X 1) and (1 X 2)
Bi/GaSb(110) interfaces, in the energy region of the semiconductor bulk
gap. Among the semimetal/III-V(110) interfaces, we found this as the
unique ordered-system showing a semimetallic character when one
monolayer of semimetal is deposited on the (110) surface, at room
temperature. Electronic loss structures induced by transitions among
localized states have been identified for the (1 X 1) interface, the
most prominent lying at about I eV. The (1 X 2) superstructure, produced
through an appropriate thermal treatment, is still semimetallic, while
the electronic loss structures shift to lower energies and present a
clear dependence on the symmetry direction of the surface Brillouin
zone.
Lingua originale | English |
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pagine (da-a) | 2911-2914 |
Numero di pagine | 4 |
Rivista | PHYSICAL REVIEW. B, CONDENSED MATTER |
Volume | 49 |
DOI | |
Stato di pubblicazione | Pubblicato - 1994 |
Keywords
- HREELS
- bismuth
- dielectric properties
- photoemission
- semiconductor surfaces