Abstract
We present a study of the thermal evolution of the Ag/Ge(1 1 1)\r\n interface by combining Scanning Electron Microscopy (SEM), Low Energy\r\n Electron Diffraction (LEED), Spatially Resolved Auger Electron\r\n Spectroscopy (SR-AES), and Atomic Force Microscopy (AFM). We followed\r\n the morphological and structural changes of a thick Ag film grown onto\r\n Ge(1 1 1)-c(2 x 8) at 300 K after annealing at selected temperatures\r\n between 370 and 800 K. The morphology of the system evolves from a flat\r\n film up to the nucleation of islands through the formation of dendritic\r\n structures. The diffraction pattern shows different intermediate surface\r\n reconstructions. We report evidences of Ge intermixing into the Ag\r\n growing layer and segregation on top of it. (C) 2003 Elsevier Science\r\n B.V. All rights reserved.
| Lingua originale | Inglese |
|---|---|
| pagine (da-a) | 213-218 |
| Numero di pagine | 6 |
| Rivista | Applied Surface Science |
| Volume | 212 |
| Numero di pubblicazione | N/A |
| DOI | |
| Stato di pubblicazione | Pubblicato - 2003 |
All Science Journal Classification (ASJC) codes
- Chimica Generale
- Fisica della Materia Condensata
- Fisica e Astronomia Generali
- Superfici e Interfacce
- Superfici, Rivestimenti e Pellicole
Keywords
- AFM
- Ag
- Ge
- LEED
- SEM
- SR-AES
- Stranski-Krastanov
- interdiffusion
- islands
- segregation