Abstract

This document explains how to use the "ZBL" tool which is useful for estimating the maximum threshold of failures during testing of chips on wafers. It consists of an Excel spreadsheet used to load data for elaboration and contains several sheets with calculations and graphs for evaluation of uploaded datasets and estimated SBL. Via a macro, all processes required for data processing have been automated: data loading, sorting and filtering, the choice of bin lists of which estimate the SBL and elaboration with generation of an output in Excel format.
Original languageEnglish
Publication statusPublished - 2011

Keywords

  • Semiconductor process control
  • Statistical Bin limit

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