TY - JOUR
T1 - Transmission function calibration of an angular resolved analyzer for X-ray photoemission spectroscopy: Theory vs experiment
AU - Drera, Giovanni
AU - Salvinelli, G.
AU - Salvinelli, Gabriele
AU - Åhlund, J.
AU - Karlsson, P. G.
AU - Wannberg, B.
AU - Magnano, E.
AU - Magnano, Elena
AU - Nappini, S.
AU - Sangaletti, Luigi Ermenegildo
PY - 2014
Y1 - 2014
N2 - In order to achieve the most accurate quantification results in an X-ray photoelectron spectroscopy (XPS) experiment, a fine calibration of the analyzer response is required. In this work an experimental characterization of a modern angle-resolved analyzer, carried out with a unfocused and a highly collimated synchrotron source, is shown. The transmission function is extrapolated from the discrepancy between experimental and theoretically predicted XPS peak areas; the influence of different sensitivity factors and of the escape depth correction on the expected values is also discussed. The analyzer response and the theoretical approach are then tested against energy dispersive XPS measurements (EDXPS). These results are finally compared with TF calculated on the basis of an high accuracy electron ray tracing code, also described in this work. © 2014 Elsevier B.V. All rights reserved.
AB - In order to achieve the most accurate quantification results in an X-ray photoelectron spectroscopy (XPS) experiment, a fine calibration of the analyzer response is required. In this work an experimental characterization of a modern angle-resolved analyzer, carried out with a unfocused and a highly collimated synchrotron source, is shown. The transmission function is extrapolated from the discrepancy between experimental and theoretically predicted XPS peak areas; the influence of different sensitivity factors and of the escape depth correction on the expected values is also discussed. The analyzer response and the theoretical approach are then tested against energy dispersive XPS measurements (EDXPS). These results are finally compared with TF calculated on the basis of an high accuracy electron ray tracing code, also described in this work. © 2014 Elsevier B.V. All rights reserved.
KW - Atomic and Molecular Physics, and Optics
KW - Condensed Matter Physics
KW - Electron analyzer
KW - Electronic, Optical and Magnetic Materials
KW - Photoelectron spectroscopy
KW - Physical and Theoretical Chemistry
KW - Radiation
KW - Spectroscopy
KW - Transmission function
KW - XPS
KW - Atomic and Molecular Physics, and Optics
KW - Condensed Matter Physics
KW - Electron analyzer
KW - Electronic, Optical and Magnetic Materials
KW - Photoelectron spectroscopy
KW - Physical and Theoretical Chemistry
KW - Radiation
KW - Spectroscopy
KW - Transmission function
KW - XPS
UR - http://hdl.handle.net/10807/98152
U2 - 10.1016/j.elspec.2014.06.010
DO - 10.1016/j.elspec.2014.06.010
M3 - Article
SN - 0368-2048
VL - 195
SP - 109
EP - 116
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
ER -