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Energy dissipation in multifrequency atomic force microscopy

  • University of Milan

Research output: Contribution to journalArticlepeer-review

Abstract

The instantaneous displacement, velocity and acceleration of a cantilever tip impacting onto a graphite surface are reconstructed. The total dissipated energy and the dissipated energy per cycle of each excited flexural mode during the tip interaction is retrieved. The tip dynamics evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip–sample interaction.
Original languageEnglish
Pages (from-to)494-500
Number of pages7
JournalBeilstein Journal of Nanotechnology
Volume5
Issue numberAprile
DOIs
Publication statusPublished - 2014

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • General Physics and Astronomy
  • Electrical and Electronic Engineering

Keywords

  • band excitation
  • multifrequency atomic force microscopy (AFM)
  • phase reference
  • wavelet transforms

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